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CRA4: Device-to-System Reliability

Device-to-System Reliability:

CHASE will develop tools for:

  • Addressing soft error mitigation.
  • Aging analysis, self-healing in mission mode, in-the-field noise and temperature measurement and analysis, fault injection analysis, remaining usable life (RUL) and time-to-failure (TTF) analyses.
  • Security and reliability of storage systems, reliability in nano-era and emerging technologies, security and reliability of multi-core processors, and system level hardware-software security analysis.

 

Distinguished Speaker: Donna Dodson of NIST
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SRC Joins CHASE
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UConn to lead $7.5 million research effort to improve security of nanoscale computer devices
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UConn, Comcast Join To Create Cybersecurity Program
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