CRA4: Device-to-System Reliability
CHASE will develop tools for:
- Addressing soft error mitigation.
- Aging analysis, self-healing in mission mode, in-the-field noise and temperature measurement and analysis, fault injection analysis, remaining usable life (RUL) and time-to-failure (TTF) analyses.
- Security and reliability of storage systems, reliability in nano-era and emerging technologies, security and reliability of multi-core processors, and system level hardware-software security analysis.