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CRA6: Standards

Standards:

CHASE develops acceptance and in-field test and measurement techniques for identifying and authenticating ICs, embedded systems, and PCBs, including:

  • Evaluation of military/industry practices for detecting counterfeit parts.
  • Evaluation of existing test techniques used in labs for counterfeit detection.
  • Technology readiness and cost analysis, cost/benefit analysis for counterfeit detection using existing techniques, development of standard test techniques for counterfeit detection to achieve highest confidence levels.
  • Low-cost electrical tests called counterfeit detection/evaluation boards (CDEB) targeting analog, digital, FPGA, memory, and mixed-signal devices.
  • Techniques for analyzing application of standard test techniques to representative parts, data collection, and proof of concept.

 

Distinguished Speaker: Donna Dodson of NIST
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SRC Joins CHASE
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