ARO/CHASE Special Workshop on Counterfeit Electronics, University of Connecticut, Jan. 28-29, 2013
Workshop Meeting Room: Ballroom 331, Student Union
Direction: Student Union is located at the center of UCONN campus. It is near UCONN Co-op and in front of School of Business. Click Here to see the map.
Student Union is also within 5 minutes walking distance from Nathan Hale Inn.
Parking: South Garage and North Garage (paid parking).
University of Connecticut: 115 North Eagleville Road, Storrs, CT 06269 (www.uconn.edu)
On Campus Hotel: Nathan Hale Inn & Conference Center, 855 Bolton Road, Storrs, CT 06268 (nathanhaleinn.com), Phone: 860-427-7888
Airport: Bradley Aiport (BDL)
Army Research Office (ARO) and CHASE Center at UConn will be organizing a special Workshop on Counterfeit Electronics in January 28-29, 2013 (Student Union, Ballroom 331) at the University of Connecticut. This two-day event will include speakers from industry, government, and academia to share their ideas, problems, and discuss issues and innovative solutions related to counterfeit detection, prevention, and supply chain security and management through talks, panels and open forum. The workshop examines the current state-of-the-are in the domain of counterfeit detection and avoidance but also put quite bit of emphasis on the challenges ahead. In addition, CHASE students will be presenting posters and demonstrate their projects related to counterfeit electronics.
Seats are limited. To register for this event, you MUST contact Prof. Tehranipoor (email@example.com) prior to the event to know the availability. Note that the registration is complementary.
See below for program, hotel, and other information for your travel.
Monday, January 28, 2013
7:30-8:15am Breakfast and Welcome Address, Dr. Cliff Wang (ARO) and Prof. Mohammad (Mark) Tehranipoor (Director, CHASE Center, UConn)
Session 1: Session Chair: Prof. Mohammad (Mark) Tehranipoor
8:15-9:00am Keynote Address: Dan DiMase, Chairman G19A, Title: Need for Industry and Government Collaboration in Preventing Counterfeit Parts
9:00-9:30am Andrew Olney, Analog Devices, Title: Counterfeit Semiconductor Products: The #1 Threat to Electronics Reliability
9:30-10:00am Dr. Brian Cohen, Institute of Defense Analysis (IDA), Title: How Far Can Test and Inspection Combat Counterfeit Products?
Session 2: Session Chair: Chris Daverse, SRC
10:30-11:00am Henry Livingston, BAE Systems, Title: Counterfeit Microelectronic Parts and Inspections & Tests That Reveal Them
11:00-11:30am Saverio Fazzari, BAH, Title: Counterfeit Parts: Tools and Guidance on Avoidance, Detection and Hidden Costs
11:30-11:50am UCONN Management Presentation
Session 3: Session Chair: Prof. Jia Di
12:50-1:20pm Lonnie Hurst, Intel: Title: Anti-Counterfeiting 2012 to Product Specification Conformance 2015
1:20-1:40pm Prof. Bahram Javidi, UConn, Title: Three Dimensional Computational Imaging for Inspection, verification, and authentication Using Quantum Optics
1:40-2:10pm Prof. Mohammad (Mark)Tehranipoor, UConn, Title: Counterfeit Test Technology Assessment and Technology Gaps
2:30-4:10pm Panel: What is the Status of Counterfeit Detection?
Where will we be in 1-5 Years?
Panel Moderator: Brian Cohen, IDA
Sultan Lilani, Integra Technologies
Christine Metz, DLA
Henry Livingston, BAE Systems
Steve Walters, Honeywell
Michael Sampson, NASA
4:10-5:45pm Poster Presentations & CHASE Students Project Demonstration (ITE Building, Lobby)
6:00-8:00pm Dinner, Nathan Hale Inn
Tuesday, January 29, 2013
7:30-8:30am Breakfast and Registration
Session 4: Session Chair: Prof. Omer Khan
8:30-9:00am Mandel Yu, Verayo, Title: Physical Unclonable Function (PUF) for Supply Chain Risk Management: An Extensible Architecture
9:00-9:30am Erik Jordan, Nisene, Title: What Information Can be Found After Decapsulation?
9:30-10:00am Daniel Marrujo, DMEA, Title: National High Reliability Electronics Virtual Center (HiREV) Overview
Session 5: Session Chair: Zachary Collier
10:30-11:00am Prof. Mohammad (Mark)Tehranipoor, UConn, Title: A Novel Silicon Authentication Platform
11:00-11:30am Tom Sharpe, SMT Corp., Title: Functional Clones – The Final Frontier of the Counterfeiter
11:30-12:00pm Janice Meraglia, Applied DNA, Title: DNA Marking: A Proactive Solution to Assure Authenticity
Session 6: Session Chair: Dr. Preston Frazier
1:00-1:30pm James Lewis, Lewis Innovative Technologies, Title: Functional Evaluation and Silicon Biometrics to Verify Component Authenticity
1:30-2:00pm Sultan Lilani, Integra Technologies, Title: Current Status of the Various Industry Standards for Mitigating Counterfeits and Challenges Ahead for Both Obsolete and Current Technology Products
2:00-2:30pm Fred Schipp, Missile Defense Agency (MDA), Title: Recommendations for Counterfeit Parts Avoidance
2:30-3:30pm Break and Poster Session
3:30-5:30pm Panel: Where Should we be in 5-10 Years?
Challenges ahead and Research Opportunities
Panel Moderator: Saverio Fazzari, BAH
Dr. Igor Linkov, ERDC
LeRoy Winemberg, Freescale
John Carulli, Texas Instruments
Julian Bristow, Honeywell
Barry Birdsong, MDA
6:00-8:00pm Dinner, Nathan Hale Inn