CRA5: Device-to-System Quality
Device-to-System Quality:
CHASE develops tools and methodologies for testing ICs and systems during manufacture, system start-up, and in the field, including:
- Methods to achieve zero-defect quality for critical systems (automotive, transportation, military, medical, etc.).
- Techniques for silicon and system debugging.
- Methods for online testing, diagnosis and failure analysis, and meeting the much sought-after zero-defect requirement.