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CRA5: Device-to-System Quality

Device-to-System Quality:

CHASE develops tools and methodologies for testing ICs and systems during manufacture, system start-up, and in the field, including:

  • Methods to achieve zero-defect quality for critical systems (automotive, transportation, military, medical, etc.).
  • Techniques for silicon and system debugging.
  • Methods for online testing, diagnosis and failure analysis, and meeting the much sought-after zero-defect requirement.

 

Distinguished Speaker: Donna Dodson of NIST
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SRC Joins CHASE
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Department of Defense Gives UConn Millions For Hardware Security
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UConn to lead $7.5 million research effort to improve security of nanoscale computer devices
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UConn, Comcast Join To Create Cybersecurity Program
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